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Electron Beam Testing Technology

206,10 €

Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

Toimittaja
John T.L. Thong
ISBN
9781489915245
Kieli
englanti
Paino
281 grammaa
Julkaisupäivä
4.6.2013
Sivumäärä
462