Tallenna
Electron Beam Testing Technology
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
- Toimittaja
- John T.L. Thong
- Painos
- Softcover reprint of the original 1st ed. 1993
- ISBN
- 9781489915245
- Kieli
- englanti
- Paino
- 310 grammaa
- Sarja
- Microdevices
- Julkaisupäivä
- 4.6.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 462
