Tallenna
Principles of Analytical Electron Microscopy
sidottu, 1986
englanti
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
- Toimittaja
- Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
- Painos
- 1986 ed.
- ISBN
- 9780306423871
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 31.7.1986
- Kustantaja
- Kluwer Academic/Plenum Publishers
- Sivumäärä
- 448
