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Electron Beam Testing Technology
Tallenna

Electron Beam Testing Technology

sidottu, 1993
englanti
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.
Toimittaja
John T.L. Thong
Painos
1993 ed.
ISBN
9780306443602
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
31.7.1993
Sivumäärä
462