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Atomic Force Microscopy
Tallenna

Atomic Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Painos
Second Edition 2019
ISBN
9783030136567
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
14.8.2020
Sivumäärä
331