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Atomic Force Microscopy
Tallenna

Atomic Force Microscopy

sidottu, 2019
englanti

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Painos
Second Edition 2019
ISBN
9783030136536
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
3.6.2019
Sivumäärä
331