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Scanning Probe Microscopy
Tallenna

Scanning Probe Microscopy

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Alaotsikko
Atomic Force Microscopy and Scanning Tunneling Microscopy
Painos
Softcover reprint of the original 1st ed. 2015
ISBN
9783662505571
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
13.10.2016
Sivumäärä
382