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High Quality Test Pattern Generation and Boolean Satisfiability

1 262 kr
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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

ISBN
9781489988478
Språk
engelska
Vikt
281 gram
Utgivningsdatum
2014-10-20
Sidor
193