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Design for Testability, Debug and Reliability
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Design for Testability, Debug and Reliability

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Undertitel
Next Generation Measures Using Formal Techniques
Upplaga
2021 ed.
ISBN
9783030692117
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2022-04-20
Sidor
164