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High Quality Test Pattern Generation and Boolean Satisfiability

Inbunden, 2012
engelska
1 228 kr
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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

ISBN
9781441999757
Språk
engelska
Vikt
518 gram
Utgivningsdatum
2012-01-31
Sidor
193