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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
Opplag
2021 ed.
ISBN
9783030683702
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
11.3.2022
Antall sider
131