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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
Opplag
2021 ed.
ISBN
9783030683672
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
11.3.2021
Antall sider
131