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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Tallenna

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.

Painos
2020 ed.
ISBN
9783030415389
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
21.3.2021
Sivumäärä
237