Siirry suoraan sisältöön
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Tallenna

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.

Painos
2020 ed.
ISBN
9783030415358
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
21.3.2020
Sivumäärä
237