
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
- Painos
- 2020 ed.
- ISBN
- 9783030415358
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 21.3.2020
- Kustantaja
- Springer Nature Switzerland AG
- Sivumäärä
- 237