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VLSI Design and Test for Systems Dependability
Tallenna

VLSI Design and Test for Systems Dependability

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts.

Toimittaja
Shojiro Asai
Painos
Softcover reprint of the original 1st ed. 2019
ISBN
9784431568636
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
26.1.2019
Sivumäärä
800