
VLSI Design and Test for Systems Dependability
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.
The book consists of three parts.
- Toimittaja
- Shojiro Asai
- Painos
- Softcover reprint of the original 1st ed. 2019
- ISBN
- 9784431568636
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 26.1.2019
- Kustantaja
- Springer Verlag, Japan
- Sivumäärä
- 800