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VLSI Design and Test for Systems Dependability
Tallenna

VLSI Design and Test for Systems Dependability

sidottu, 2018
englanti

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.

The book consists of three parts.

Toimittaja
Shojiro Asai
Painos
1st ed. 2019
ISBN
9784431565925
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
1.8.2018
Sivumäärä
800