Tallenna
Three-Dimensional X-Ray Diffraction Microscopy
Kirjailija:
nidottu, 2013
englanti
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
- Alaotsikko
- Mapping Polycrystals and their Dynamics
- Kirjailija
- Henning Friis Poulsen
- Painos
- Softcover reprint of the original 1st ed. 2004
- ISBN
- 9783662145432
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 3.10.2013
- Sivumäärä
- 156
