Tallenna
Three-Dimensional X-Ray Diffraction Microscopy
Kirjailija:
sidottu, 2004
englanti
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
- Alaotsikko
- Mapping Polycrystals and their Dynamics
- Kirjailija
- Henning Friis Poulsen
- Painos
- 2004 ed.
- ISBN
- 9783540223306
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 31.8.2004
- Sivumäärä
- 156
