Tallenna
Synthetic Polymeric Membranes
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. deals with the synthesis of membranes, the properties of membranes, and the application of membranes.
- Alaotsikko
- Characterization by Atomic Force Microscopy
- Kirjailija
- K. C. Khulbe, C. Y. Feng, Takeshi Matsuura
- Painos
- 2008 ed.
- ISBN
- 9783540739937
- Kieli
- englanti
- Paino
- 446 grammaa
- Sarja
- Springer Laboratory
- Julkaisupäivä
- 17.12.2007
- Sivumäärä
- 198
