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Semiconductor Device Reliability
Tallenna

Semiconductor Device Reliability

sidottu, 1989
englanti
This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions.
Painos
1990 ed.
ISBN
9780792305361
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
31.12.1989
Kustantaja
Springer
Sivumäärä
575