Tallenna
Semiconductor Device Reliability
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions.
- Toimittaja
- A. Christou, B.A. Unger
- Painos
- Softcover reprint of the original 1st ed. 1990
- ISBN
- 9789401076203
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 5.10.2011
- Kustantaja
- Springer
- Sivumäärä
- 575
