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Scanning Probe Microscopy
Tallenna

Scanning Probe Microscopy

sidottu, 2015
englanti

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Alaotsikko
Atomic Force Microscopy and Scanning Tunneling Microscopy
Painos
2015 ed.
ISBN
9783662452394
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
23.3.2015
Sivumäärä
382