Tallenna
Progress in Nanoscale Characterization and Manipulation
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
- Toimittaja
- Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
- Painos
- Softcover Reprint of the Original 1st 2018 ed.
- ISBN
- 9789811344206
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 11.1.2019
- Kustantaja
- Springer Verlag, Singapore
- Sivumäärä
- 508
