Tallenna
Progress in Nanoscale Characterization and Manipulation
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
- Toimittaja
- Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
- Painos
- 2018 ed.
- ISBN
- 9789811304538
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 14.9.2018
- Kustantaja
- Springer Verlag, Singapore
- Sivumäärä
- 508
