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Physical Limitations of Semiconductor Devices
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Physical Limitations of Semiconductor Devices

In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems.
Painos
1st ed. Softcover of orig. ed. 2008
ISBN
9781441945051
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.10.2010
Sivumäärä
330