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Physical Limitations of Semiconductor Devices
Tallenna

Physical Limitations of Semiconductor Devices

sidottu, 2008
englanti
In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems.
Painos
2008 ed.
ISBN
9780387745138
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
18.4.2008
Sivumäärä
330