
Microscopic Techniques for the Non-Expert
This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools.
- Painos
- 2022 ed.
- ISBN
- 9783030995447
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 29.6.2023
- Kustantaja
- Springer Nature Switzerland AG
- Sivumäärä
- 247