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Microscopic Techniques for the Non-Expert
Tallenna

Microscopic Techniques for the Non-Expert

This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools.

Painos
2022 ed.
ISBN
9783030995447
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
29.6.2023
Sivumäärä
247