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Microscopic Techniques for the Non-Expert
Tallenna

Microscopic Techniques for the Non-Expert

sidottu, 2022
englanti

This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools.

Painos
2022 ed.
ISBN
9783030995416
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
28.6.2022
Sivumäärä
247