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Microelectronic Test Structures for CMOS Technology
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Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products.

Painos
2011 ed.
ISBN
9781489990556
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.10.2014
Sivumäärä
373