
Matching Properties of Deep Sub-Micron MOS Transistors
The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
- Kirjailija
- Jeroen A. Croon, Willy M Sansen, Herman E. Maes
- Painos
- Softcover reprint of hardcover 1st ed. 2005
- ISBN
- 9781441937186
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 1.12.2010
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 206