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Matching Properties of Deep Sub-Micron MOS Transistors
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Matching Properties of Deep Sub-Micron MOS Transistors

The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter.

The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.

Painos
Softcover reprint of hardcover 1st ed. 2005
ISBN
9781441937186
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.12.2010
Sivumäärä
206