
Matching Properties of Deep Sub-Micron MOS Transistors
The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
- Kirjailija
- Jeroen A. Croon, Willy M Sansen, Herman E. Maes
- Painos
- 2005 ed.
- ISBN
- 9780387243146
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 24.3.2005
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 206