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Matching Properties of Deep Sub-Micron MOS Transistors
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Matching Properties of Deep Sub-Micron MOS Transistors

The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter.

The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.

Painos
2005 ed.
ISBN
9780387243146
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
24.3.2005
Sivumäärä
206