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Introduction to Quantum Metrology
Tallenna

Introduction to Quantum Metrology

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics.

Alaotsikko
Quantum Standards and Instrumentation
Painos
Softcover reprint of the original 1st ed. 2015
ISBN
9783319384795
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
9.10.2016
Sivumäärä
279