Tallenna
Failure Analysis of Integrated Circuits
nidottu, 2012
englanti
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
- Alaotsikko
- Tools and Techniques
- Toimittaja
- Lawrence C. Wagner
- Painos
- Softcover reprint of the original 1st ed. 1999
- ISBN
- 9781461372318
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 9.11.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 255
