Tallenna
Failure Analysis of Integrated Circuits
sidottu, 1999
englanti
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
- Alaotsikko
- Tools and Techniques
- Toimittaja
- Lawrence C. Wagner
- Painos
- 1999 ed.
- ISBN
- 9780412145612
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 31.1.1999
- Kustantaja
- Chapman and Hall
- Sivumäärä
- 255
