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Electron and Ion Microscopy and Microanalysis
Tallenna

Electron and Ion Microscopy and Microanalysis

sidottu, 1991
englanti
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Alaotsikko
Principles and Applications, Second Edition,
Toimittaja
Lawrence E Murr
ISBN
9780824785567
Kieli
englanti
Paino
1587 grammaa
Julkaisupäivä
25.7.1991
Kustantaja
CRC Press Inc
Sivumäärä
856