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Electron and Ion Microscopy and Microanalysis
Tallenna

Electron and Ion Microscopy and Microanalysis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Alaotsikko
Principles and Applications, Second Edition,
Toimittaja
Lawrence E Murr
ISBN
9780367402945
Kieli
englanti
Paino
453 grammaa
Julkaisupäivä
29.10.2019
Kustantaja
CRC Press
Sivumäärä
856