Tallenna
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Kirjailija:
sidottu, 2007
englanti
Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc.
- Kirjailija
- Manoj Sachdev, José Pineda de Gyvez
- Painos
- 2nd ed. 2007
- ISBN
- 9780387465463
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 21.6.2007
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 328
