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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Alaotsikko
Process-Aware SRAM Design and Test
Painos
Softcover reprint of hardcover 1st ed. 2008
ISBN
9789048178551
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
28.10.2010
Kustantaja
Springer
Sivumäärä
194