
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Alaotsikko
- Process-Aware SRAM Design and Test
- Kirjailija
- Andrei Pavlov, Manoj Sachdev
- Painos
- Softcover reprint of hardcover 1st ed. 2008
- ISBN
- 9789048178551
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 28.10.2010
- Kustantaja
- Springer
- Sivumäärä
- 194