Tallenna
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Kirjailija:
sidottu, 2008
englanti
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Alaotsikko
- Process-Aware SRAM Design and Test
- Kirjailija
- Andrei Pavlov, Manoj Sachdev
- Painos
- 2008 ed.
- ISBN
- 9781402083624
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 21.6.2008
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 194
