Tallenna
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
nidottu, 2013
englanti
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command.
- Toimittaja
- Samuel H. Cohen, Marcia L. Lightbody
- Painos
- Softcover reprint of the original 1st ed. 1997
- ISBN
- 9781475793277
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 4.6.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 250
