Tallenna
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
sidottu, 1997
englanti
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command.
- Toimittaja
- Samuel H. Cohen, Marcia L. Lightbody
- Painos
- 1997 ed.
- ISBN
- 9780306455964
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 30.4.1997
- Kustantaja
- Kluwer Academic/Plenum Publishers
- Sivumäärä
- 250
