Tallenna
Atom-Probe Tomography
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.
- Alaotsikko
- The Local Electrode Atom Probe
- Kirjailija
- Michael K. Miller, Richard G. Forbes
- Painos
- Softcover reprint of the original 1st ed. 2014
- ISBN
- 9781489977908
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 17.9.2016
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 423
