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Atom-Probe Tomography
Tallenna

Atom-Probe Tomography

sidottu, 2014
englanti

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.

Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.

Alaotsikko
The Local Electrode Atom Probe
Painos
2014 ed.
ISBN
9781489974297
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
2.8.2014
Sivumäärä
423