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Analog IC Reliability in Nanometer CMOS
Tallenna

Analog IC Reliability in Nanometer CMOS

This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.

ISBN
9781489986306
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
19.6.2015
Sivumäärä
198