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Analog IC Reliability in Nanometer CMOS
Tallenna

Analog IC Reliability in Nanometer CMOS

This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.

ISBN
9781461461623
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
9.1.2013
Sivumäärä
198