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AFM-Based Observation and Robotic Nano-manipulation
Tallenna

AFM-Based Observation and Robotic Nano-manipulation

Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment.
Painos
2020 ed.
ISBN
9789811505102
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
26.8.2021
Sivumäärä
184