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AFM-Based Observation and Robotic Nano-manipulation
Tallenna

AFM-Based Observation and Robotic Nano-manipulation

sidottu, 2020
englanti
Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment.
Painos
2020 ed.
ISBN
9789811505072
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
16.2.2020
Sivumäärä
184