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Advanced Test Methods for SRAMs

120,90 €

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

Alaotsikko
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
ISBN
9781489983145
Kieli
englanti
Paino
281 grammaa
Julkaisupäivä
3.9.2014
Sivumäärä
171