Tallenna
Advanced Test Methods for SRAMs
Kirjailija:
nidottu, 2014
englanti
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.
- Alaotsikko
- Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
- Painos
- 2010 ed.
- ISBN
- 9781489983145
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 3.9.2014
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 171
