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Acoustic Scanning Probe Microscopy
Tallenna

Acoustic Scanning Probe Microscopy

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave.
Painos
2013 ed.
ISBN
9783642430794
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
9.11.2014
Sivumäärä
494