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Acoustic Scanning Probe Microscopy
Tallenna

Acoustic Scanning Probe Microscopy

sidottu, 2012
englanti
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave.
Painos
2013 ed.
ISBN
9783642274930
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
4.10.2012
Sivumäärä
494