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Interfacial Compatibility in Microelectronics
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Interfacial Compatibility in Microelectronics

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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
Undertitel
Moving Away from the Trial and Error Approach
Upplaga
2012 ed.
ISBN
9781447160687
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-02-22
Sidor
218