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Interfacial Compatibility in Microelectronics

1 875 kr
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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.

Undertitel
Moving Away from the Trial and Error Approach
ISBN
9781447160687
Språk
engelska
Vikt
281 gram
Utgivningsdatum
2014-02-22
Sidor
218